The Characterisation Facility is complementary to the fabrication capability provided by the Queensland Microtechnology Facility
It provides material and device characterisation capability in the micro- and nanoscale. The Facility received a partial support from the Australian National Fabrication Facility (ANFF).
Explore the unique facility features below.
- Attenuated-total-reflection add-on for infra-red spectrophotometer
Atomic Force and Electron Microscopy Laboratory
- AFM, Park Systems NX20
- SEM, Joel JSM 6510